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Low Temperature Scanning Hall Probe Microscope
For Low Temperature Scanning Hall Probe Microscopes, we use a micro/nano-fabricated Hall sensor to measure the local magnetic flux density across the sample surface. The sensor is brought into close proximity of the sample surface using STM or AFM positioning techniques. We achieved 50nm lateral resolution at 300K.
Our systems also have MFM, AFM & STM options, so that you do not have to buy a second SPM. The standard AFM option uses dynamic mode operation with quartz crystal or Akiyama sensors. The second AFM Option that we have developed recently uses a fibre optic interferometer operating at 1320nm wavelength. You can run it in contact, non-contact and Tapping modes. The Spreading resistance/Conductive AFM, MFM and EFM are also available.
- Quantitative & Non-invasive magnetic measurements with Scanning Hall Probe Microscopy with up to 50 nm spatial resolution!!
- Multi-Mode: AFM, MFM, STM, EFM options.
- Real time scanning with SHPM!!
- Image Local magnetic fields with unprecedented sensitivity:
60nT/√Hz@77K, 6nT/√Hz@4.2K
- Fits into almost any cryostat: 23.6 mm or 25.4 mm OD
- Realtime scans (~1 frame/second) to investigate dynamic magnetic phenomena
- Large scan area at 4.2 K : 16µm x 16µm
- Optional 6µm x 6µm and 1.5 µm x 1.5 µm scan areas.
- 3mm range X-Y Positioners
Technical Specs & More Information |
