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ezAFM+

ezAFM
ezAFM
ezAFM Bag
ezAFM Bag 4
Aqua Cantilever
Cantilever ezAFM
ezAFM Manual Sample Positioner
ezAFM Motorized Sample Positioner 2
ILM ezAFM
Signal Access Module ezAFM
ezAFM
ezAFM
ezAFM Bag
ezAFM Bag 4
Aqua Cantilever
Cantilever ezAFM
ezAFM Manual Sample Positioner
ezAFM Motorized Sample Positioner 2
ILM ezAFM
Signal Access Module ezAFM
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Overview
Specifications
Optional Accessories
Modes
Overview

ezAFM+

The ezAFM+ is a robust, compact Atomic Force Microscopy system which capable of providing high resolution images. The ezAFM+ is versatile and has numerous applications in materials science, biology, chemistry, physics, industrial and aerospace research. While Ease-of-use and pricing make it ideal for high school and university teaching laboratories, the capabilities and performance of the ezAFM+ have attracted more advanced users from some of the more important international institutes, universities and industrial laboratories as well.

The ezAFM+ operates in Dynamic Mode, Contact Mode, Lateral Force Microscopy, Magnetic Force Microscopy and Liquid Mode. User may purchase a system with one standard scan mode or optionally up to a maximum of 5 scan modes.  These additional modes can be purchased later, if needed.  When purchased, the ezAFM+ package typically includes a controller, scan head, vibration isolation unit, laptop, user tool kit and a cantilever starter pack.  Users may install the system by following simple plug and play instructions as described in the manual.  Software installation and system tests are made from remote by our ezAFM+-Application Scientists. Installation is followed by some training in making simple measurements.

ezAFM+ Design

 

ROBUST & FLEXIBLE:  The design of the ezAFM+ allows users to replace/exchange the scan heads easily, safely and frequently.  Each system can have scan heads for different scan size, Z range or air/liquid mediums. 

EASE-OF-USE: In most commercial AFMs, replacement of the cantilever can be a daunting task for the user as it involves realigning the laser and photodiode after each cantilever exchange.   Nanomagnetics Instruments Limited has made this routine simple and easy by utilising the fact that there is a vast range of commercially available cantilevers which have alignment grooves on the back side of the chip.  Specially designed ‘alignment chips’ are incorporated in the design of our scanner heads, in such manner, that when the cantilevers are mounted, they will locate in the exactly the same position with respect to the laser beam thereby eliminating the need realign the laser or the photodiode.

COMPACT & PORTABLE:  With a footprint of only 70cm x 30cm (including the laptop), the ezAFM+ requires little operating space.  It is light and comes packed in a durable pelican case for easy transportation or storage.  The microscope can also be placed in a glovebox in situations where enhanced environmental control is required.  

VERSATILE:  NanoMagnetics Instruments offers two different scan heads for the ezAFM+ for operation in ambient conditions. The ezAFM+120 scan head has a maximum scan area up to 120x120x40µm and is best suited for samples with rough surfaces and it provides a 0.2 nm resolution in Z.  The 40um Z range is much larger than that offered by most commercial systems allowing for imaging of a greater range of corrugated sample like textiles, fibres and paper pulp. The ezAFM+40 scan head, on the other hand, has a maximum scan area is 40x40x4µm and with a 0.02nm resolution (in Z), which will allow you to scan single layer graphene surfaces.   Additionally, although the typical sample size for the ezAFM+ is 10x10x5 mm, it can be easily reconfigured to images very large surfaces.

A separate Aqua Head is available for imaging in liquid environment.  Both air/liquid heads may also be integrated with an Inverted Light Microscope (ezAFM+-ILM) of your choice.

Specifications
XY Manual Stage

Sample positioning is achieved using a flexure stage with movement controlled through manual screws with movement range of 2x2mm with 10µm resolution. Fine position of sample is adjusted by moving manuel stage.

XY Motorized Stage

Remotable and automatic sample movement in X and Y directions can be achieved using motorize movement stage unit with software control with 19×19 mm movement range.

Signal Access Module (SAM)

Signal Access Module provides input and output signal access between electronic and microscope. The Signal Access Module has 2 spare analog input channels with and 7 output channels. RMS and phase signal for cantilever tuning, cantilever excitation signal and cantilever movement in X,Y and Z directions can be obtained from output channels.

Technical Specifications:

Input Channels:
±5V, 24-byte resolution
Output Channels:
RMS, Phase, X, Y, Z: ±5V, 24-byte resolution
Force, Excitation Out: ±5V and ±15V with 16- byte resolution respectively

ezAFM+ Inverted Light Microscope:

ezAFM – ILM system consists of 3 parts: ezAFM Scanner Head, XY Flexture Stage and ezAFM – ILM Adaptor Stage. The XY Flexture Stage moves the cantilever position with 2 mm range. Coaxial illumination is the top light source of the system, and except from ezAFM camera integrated inside of the ezAFM, the cantilever and also the sample can be observed from the ILM. Coarse z movement stage is adjusted for thicker samples.

Technical Specifications:

Scan Range 120x120x40 µm 40x40x4 µm
XY Resolution <1 nm <5 nm
Z Resolution 0.2 nm 0.02 nm
Cantilever Alignment Alignment free cantilevers Alignment free cantilevers
Optical Microcsope(Camera) 8MP, 2µm resolution 8MP, 2µm resolution
Field of View (FOV) 390×230 µm 390×230 µm
Camera Pixels 3264×2448 3264×2448
Video Camera 30 fps 30 fps
Controller 24 Bit ADCs/DACs 24 Bit ADCs/DACs
Noise Floor 65fm/√Hz 65fm/√Hz
Digital Feedback FPGA/DSP FPGA/DSP
Connection USB interface USB interface
Modes Dynamic, Contact, MFM, LFM Dynamic
Liquid Cell Adapters For Olympus IX, Nikon Eclipse series and others For Olympus IX, Nikon Eclipse series and others
User License Unlimited Unlimited

Optional Accessories
XY Manual Stage

Sample positioning is achieved using a flexure stage with movement controlled through manual screws with movement range of 2x2mm with 10µm resolution. Fine position of sample is adjusted by moving manuel stage.

XY Motorized Stage

Remotable and automatic sample movement in X and Y directions can be achieved using motorize movement stage unit with software control with 19×19 mm movement range.

Signal Access Module (SAM)

Signal Access Module provides input and output signal access between electronic and microscope. The Signal Access Module has 2 spare analog input channels with and 7 output channels. RMS and phase signal for cantilever tuning, cantilever excitation signal and cantilever movement in X,Y and Z directions can be obtained from output channels.

Technical Specifications:

Input Channels:
±5V, 24-byte resolution
Output Channels:
RMS, Phase, X, Y, Z: ±5V, 24-byte resolution
Force, Excitation Out: ±5V and ±15V with 16- byte resolution respectively

ezAFM – ILM
ezAFM – ILM system consists of 3 parts: ezAFM Scanner Head, XY Flexture Stage and ezAFM – ILM Adaptor Stage. The XY Flexture Stage moves the cantilever position with 2 mm range. Coaxial illumination is the top light source of the system, and except from ezAFM camera integrated inside of the ezAFM, the cantilever and also the sample can be observed from the ILM. Coarse z movement stage is adjusted for thicker samples.

Technical Specifications:

Scan Range 120x120x40 µm 40x40x4 µm
XY Resolution <1 nm <5 nm
Z Resolution 0.2 nm 0.02 nm
Cantilever Alignment Alignment free cantilevers Alignment free cantilevers
Optical Microcsope(Camera) 8MP, 2µm resolution 8MP, 2µm resolution
Field of View (FOV) 390×230 µm 390×230 µm
Camera Pixels 3264×2448 3264×2448
Video Camera 30 fps 30 fps
Controller 24 Bit ADCs/DACs 24 Bit ADCs/DACs
Noise Floor 65fm/√Hz 65fm/√Hz
Digital Feedback FPGA/DSP FPGA/DSP
Connection USB interface USB interface
Modes Dynamic, Contact, MFM, LFM Dynamic, Contact, MFM, LFM
Liquid Cell Adapters For Olympus IX, Nikon Eclipse series and others For Olympus IX, Nikon Eclipse series and others
User License Unlimited Unlimited

Modes

Dynamic Mode
Contact Mode
Lateral Force Microscopy
Magnetic Force Microscopy
Electrostatic Force Microscopy
Piezo Response Force Microscopy
Kelvin Probe Force Microscopy
Conductive AFM
Scanning Spreading Resistance Microscopy
Lithography
Liquid Modes

info@nanomagnetics-inst.com
+44 (790) 615 95 08
NanoMagnetics Instruments Ltd. Suite 290, 266 Banbury Road Oxford OX2 7DL
Copyright © 2020 Nanomagnetics Instruments, All rights reserved.
ezAFM

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