With the help of a micron-sized semiconductor Hall sensor probe, our LT-SHPM enables user to map the surface Hall voltage V H as a function of position, which directly gives the spatial distribution of the local magnetic induction.
SHPM systems provides high spatial resolution (~300 nm) imaging with high magnetic field sensitivity. Unlike the magnetic force microscope the SHPM provides direct quantitative information on the magnetic materials without destructing samples. The SHPM can also image magnetic induction under applied fields up to ~16 tesla and over a wide range of temperatures (millikelvins to 300 K). Together with Hall probes, this microscope can be used with STM and QTF probes to conduct Scanning Tunneling Microscopy Imaging and Non-Contact Mode Atomic Force Microscopy Imaging with Quartz Tuning Fork probes.