The MK-AFM/MFM is an alignment-free Atomic
Force Microscopy system equipped with a Fibre Interferometer operating at 1310
nm, 15 fm/√Hz noise level with an operation range of 20mK-300K, and up to 16T
The alignment-free design creates a user
friendly utilization; the Fibre Interferometer carries the light by means of a fibre
cable with respect to the end of the cantilever, and is used to measure the
deflection of the cantilever;
meanwhile which is providing a 10nm magnetic
resolution at 4K. Alignment chips with three protrusions compatible with
commercial cantilevers eliminate the need of optical alignment by the end user.
The MK-AFM/MFM allows the characterization of
materials by offering various imaging modes; Scanning Hall
Probe Microscopy, Magnetic Force Microscopy,
Electric Force Microscopy, Kelvin Probe Force Microscopy, Conductive AFM.
The instrumentation and the unique design of
the MK-AFM/MFM microscope allows it to be customized for different cryostat
The microscope head consists of two
concentrical piezotubes; the inner piezo tube for scanning and the outer for sample
The scanning piezo is composed of quadrant
electrodes and a dither piezo to dither the cantilever and comes with three
different options upon request.
The sample approach is done by a stick-slip
motion; allowing 10mm motion in Z and Ø3mm in XY, with a sensitivity of 50nm.
Electronic signals are generated by the
powerful MK-AFM/MFM elctronic via BNC outputs; transferred to the microscope
through LEMO connections.