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Low Temperature Scanning Near-Field Optical Microscope

SNOM
SNOM

NanoMagnetics Instruments
LT-SNOM

LT-SNOM has the capability of near-field imaging and spectroscopy together with other AFM modes such as contact, dynamic, MFM, cAFM. A sample is illuminated optically by introducing a laser beam through specially designed optical fiber. The detected optical signal is transmitted via a fiber tip to a spectrometer. A topographic image can be obtained simultaneously with an optical image.

Scan Head Options

Ultra Large Area
200x200x7.2μm @ 300K
50x50x4.8μm @77K
30x30x2.4μm @4.2K
Large Area
150x150x7μm @ 300K
36x36x1.8μm @77K
18x18x0.8μm @4.2K
Standard Area
52x52x4.8μm @ 300K
14x14x1.2μm @77K
6x6x0.5μm @4.2K