Hall Effect Measurement System

hall effect measurement systems
HEMS

HALL EFFECT MEASUREMENT SYSTEM (HEMS)

The HEMS systems have an integrated hardware and software system designed to measure and analyze the electronic properties of samples.

The system design offers the possibility to take measurements under the magnetic field up to 2.5 Tesla.

At the same time, the system offers the opportunity to take measurements in the range of 3K-1273K with 2 different temperature measuring heads, while it provides an easy assembly of samples related to the probe system that can move in 3 different axes.

NMI – Hall Effect Measurement System (HEMS) device Performs electrical characterization of semiconductor, organic conductor and metal oxide materials. These materials developed with nanotechnology methods are used in the development of chip technology, the development of solar cells, the development of material science, space technology, defense industry.

Measurement Specifications

Carrier Mobility: 10-1 to 107 cm2/Vsec
Carrier concentration: upto 1022 /cm3
Resistivity: 10-5 to 109 ohms cm

Low Temperature AC-DC Measurement & Characterization

Static Insert

• Six contacts for Hall effect, four contacts for van der Pauw measurement
• Sample size: max 10mm x 10mm
• up to 12 contacts to sample
• 29mm OD sample insert (other sizes are optional)
• 25 spare sample holders
• Measurement electronics and control software
• Temperature range: 1-300K

Rotary Insert (Vertical and Horizontal Rotator)

• Rotation: 00-3600 with 0.016 resolution
• Sample size: max 5mm x 10mm
• up to 12 contacts to sample
• 29mm OD sample insert (other sizes are optional)
• 25 spare sample holders
• Measurement electronics and control software
• Temperature range: 1—300K
• KF50 or KF40 flange option

DC Resistance / Hall Effect Measurements

• Source current programming range : 50pA to IA •
• Voltage measurement range: 100mV (100nV resolution) to 100V (IOpV resolution)
• Temperature range: 1-300K
AC Resistance / Hall Effect Measurements
• Source current programming range: 2nA to 100mA *
• Frequency range: IHz to 1kHz
• Real and imaginary parts of impedance Z(T)
• Voltage noise (with ow noise voltage preamplifier): lnVNHz noise floor at 1kHz at 60dB gain

AC Susceptibility Measurement

• Sample Size: Max 5 mm diameter
• AC Frequency Range: IOHz to 10kHz
• AC Field Amplitude Range: 2mOe to 150e
• Sensitivity: 2 x 10-7 emu (2 x 10 IOAm2at 10kHz)
• Real and imaginary parts of susceptibility (T)
• Includes calibrated sensor at sample stage/pick-up coils
• Measurement electronics and control software
• Temperature Range: 1-300K

Options

• Low noise voltage preamplifier for AC Resistance
. 1 5 nV/QHz voltage noise floor at 1 kHz
Voltage input range: ± 5V at xl gain
Common mode rejection: 120dB at 1 kHz
• Calibrated Thermometer and Heater at the Sample Stage
• 400K High Temperature Option for measurement probes