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LT-AFM/MFM

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Overview
Overview

LT-AFM/MFM

The LT-AFM/MFM is an alignment-free Atomic Force Microscopy system equipped with a Fibre Interferometer operating at 1310 nm, 15 fm/√Hz noise level with an operation range of 20mK-300K, and up to 16T magnetic field.

The alignment-free design creates an user friendly utilization; the Fibre Interferometer carries the light by means of a fibre cable with respect to the end of the cantilever, and is used to measure the deflection of the cantilever;

meanwhile providing a 10nm magnetic resolution at 4K. Alignment chips with three protrusions compatible with commercial cantilevers eliminate the need of optical alignment by the end user.

The LT-AFM/MFM allows the characterization of materials by offering various imaging modes; Scanning Hall Probe Microscopy, Magnetic Force Microscopy, Electric Force Microscopy, Kelvin Probe Force Microscopy, Conductive AFM.

The instrumentation and the unique design of the LT-AFM/MFM microscope allows it to be customized for different cryostat dimensions.

The microscope head consists of two concentrical piezotubes; the inner piezo tube for scanning and the outer for sample positioning.

The scanning piezo is composed of quadrant electrodes and a dither piezo to dither the cantilever and comes with three different options upon request.

The sample approach is done by a stick-slip motion; allowing 10mm motion in Z and Ø3mm in XY, with a sensitivity of 50nm.

Electronic signals are generated by the powerful LT-AFM/MFM elctronic via BNC outputs; transferred to the microscope through LEMO connections.

info@nanomagnetics-inst.com
+44 (790) 615 95 08
NanoMagnetics Instruments Ltd. Suite 290, 266 Banbury Road Oxford OX2 7DL
Copyright © 2020 Nanomagnetics Instruments, All rights reserved.
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https://secureservercdn.net/160.153.137.40/433.f39.myftpupload.com/wp-content/uploads/2020/05/mK-SPM.pdf

 

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