Z noise floor is frequently used as a simple parameter to quantify instrument performance because it indicates the lower limit of precision

Atomic force microscopy (AFM) is an excellent method for characterizing the topography of polymer films and artifacts, as well as many...

Dimensional measurements of nanoparticles are critical for their applicability in a variety of disciplines.

A polymer (the name means "many parts") are long chain molecules that make up many repeating units called monomers. Polymers can be...

Graphene is the name given to one of the honeycomb braided structures of the carbon atom. One of the most interesting elements in the...

The HEMS systems have an integrated hardware and software system designed to measure and analyze the electronic properties of samples....

Scanning Probe Microscopes (SPMs) are notable for their capacity to observe features at the atomic and molecular level, allowing us to get..

Optical microscopes were the first form of microscope to be designed and employed in scientific research, but their powers were quickly...

LOW TEMPERATURE MICROSCOPE The new fiber Fabry-Pérot interferometer integrated to our low temperature atomic force/magnetic force...

1. History of MFM Scanning probe microscopy (SPM) techniques such as scanning tunneling microscopy (STM) and atomic force microscopy...

With the invention of the scanning probe microscope (STM) in 1981, the family of scanning probe microscopes was born. While working at...

How AFM works All of these are reasonable concerns that arise while purchasing or getting started with AFM. We believe that by providing...