Scanning Probe Microscopes

These specific group of microscopes are assembled to measure various surface properties of materials and are widely used  in scientific and technological applications. They are complementary to the traditional optical and electron microscopes and have extensive applications beyond simple surface topography measurements.

Similar to above mentioned properties, these microscopes are engineered to work under extremely low temperatures (˂10mK) and high magnetic fields (˃20T). We customize our products to fit in to our customers` existing cryostats or dilution fridges. Turnkey solutions are also available. They are mostly used for magnetic or superconducting material studies.

Measurement and Characterization Systems

These group of products are designed for electric transport and magnetic properties measurements. Measurements like, Hall Effect, Van der Pauw, 2-4 contact resistivity, angle depended resistivity, and susceptibility etc. can be performed. Various units allow the user to compose the proper measurement setup for exact needs. Each unit is also configurable internally. Systems have their own dedicated automation software written in Labview. Our products in this group are; Hall Effect Measurement System (HEMS) with electromagnet, table top HEMS unit (ezHEMS), 4 Point IV Measurement Setup, Variable Sample Magnetometer (VSM), Vertical (Swedish) Sample Rotator, Horizontal Sample Rotator, AC Sussceptometer

The electronic control and signal processing requirements possessed by our products, gave us the distinctive capability of analog and digital design. The controllers we use with our systems and emerged components can be used independently for different purposes. USB PLL, USB Interferometer, Gaussmeter and SPM Controllers belong to this product group.

Controller and Standalone Electronics