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LT-SNOM | Low Temperature Microscope

LT-SNOM has the capability of near-field imaging and spectroscopy together with other AFM modes such as contact, dynamic, MFM, cAFM. A sample is illuminated optically by introducing a laser beam through specially designed optical fiber.

LT-SNOM
Low Temperature Scanning Near-Field Optical Microscope

NanoMagnetics Instruments LT-SNOM

LT-SNOM has the capability of near-field imaging and spectroscopy together with other AFM modes such as contact, dynamic, MFM, cAFM. A sample is illuminated optically by introducing a laser beam through specially designed optical fiber. The detected optical signal is transmitted via a fiber tip to a spectrometer. A topographic image can be obtained simultaneously with an optical image.


Scan Head Options

Ultra Large Area

200x200x7.2μm @ 300K

50x50x4.8μm @77K

30x30x2.4μm @4.2K


Large Area

150x150x7μm @ 300K

36x36x1.8μm @77K

18x18x0.8μm @4.2K


Standard Area

52x52x4.8μm @ 300K

14x14x1.2μm @77K

6x6x0.5μm @4.2K