LT-sSNOM | Low Temperature Microscope
LT-sSNOM has the capability of near-field imaging and spectroscopy together with other AFM modes such as contact, dynamic, MFM, cAFM, KPFM, PRFM. The tip-sample interface is illuminated by off axis parabolic mirror and scattered light is detected by heterodyne interferometer.
Low Temperature Scattering Scanning Near-Field Optical Microscope
NanoMagnetics Instruments LT-sSNOM
LT-sSNOM has the capability of near-field imaging and spectroscopy together with other AFM modes such as contact, dynamic, MFM, cAFM, KPFM, PRFM. The tip-sample interface is illuminated by off axis parabolic mirror and scattered light is detected by heterodyne interferometer. A topographic image can be obtained simultaneously with an optical image.
Product Specifications
532 nm - 20 µm wavelength range with metallic mirrors
AFM with fiber interferometer
Piezo scanner, 30x30x15μm Scan area @4 K
6x6x12mm Range XYZ Sample Nanopositioner
4x4x6mm Range XYZ Nanopositioner for Off Axis Parabolic mirror
200 nm resolution resistive position sensors
49 mm Outer Diameter
10mK to 300 K temperature range
Up to 31 T Magnetic Field
Sample holder with 8 electrical contacts
Contact/Dynamic/ ncAFM/MFM/cAFM/KPFM/PRFM/EFM modes
Applications and use cases
Low-temperature scanning-probe and nanoscale imaging experiments using the measurement modes and environmental options supported by the selected platform.
Selection and configuration guidance
Provide sample type and dimensions, scan or travel range, target resolution, temperature and field range, vacuum level, optical access, wiring, vibration constraints, and controller requirements.
Request a configuration review
Contact NanoMagnetics Instruments with your sample, measurement, environmental, and integration requirements. The technical team will review compatibility, recommend the required options and accessories, and prepare a configuration-specific quotation for LT-sSNOM.