HEMS & LT-AC/DC | Hall Effect Measurement System

Hall Effect Measurement System (HEMS)

High-Precision Electronic Transport Characterization

The NanoMagnetics Instruments Hall Effect Measurement System (HEMS) is a fully integrated, automated platform designed for the comprehensive characterization of semiconductor devices, thin films, and advanced electronic materials. Engineered for both high-stakes academic research and industrial quality control, HEMS provides precise data on carrier concentration, Hall mobility, carrier type, and resistivity with industry-leading sensitivity.

Fully Automated, Cryogen-Free Characterization

NMI has developed a user-friendly, compact, and completely automated Hall effect measurement solution. By utilizing a cryogen-free design, the system eliminates the ongoing costs and logistical burdens of liquid helium consumption. Our integrated control software manages the entire measurement cycle—from sample temperature stabilization to magnetic field ramping—delivering reproducible results with minimal user intervention.

Versatile Configurations for Diverse Research Needs

Whether you are testing next-generation solar cells or investigating fundamental semiconductor physics, HEMS can be configured with a variety of magnet and insert options:

• Electromagnet Options: Available with air-cooled or water-cooled electromagnets for high-throughput benchtop measurements.

• Superconducting Magnet Integration: Reach fields up to 14 Tesla for demanding experiments requiring extreme magnetic environments.

• Wide Temperature Range: Precise control from base temperatures up to 400K with exceptional stability of +/- 2 mK.

Critical Applications in Research & Industry

The HEMS platform is an essential tool for advancements in:

• Solar Cell Development and Photovoltaic Optimization

• Materials Science & Thin Film Quality Control

• Defense Industry and Aerospace Materials Testing

• Fundamental Physics and Cryogenic Transport Measurements