ezAFM+ | Atomic Force Microscope
ezAFM+ is our compact atomic force microscopy system. We offer two different scan head options which are 40x40x4 µm or 120x120x40 µm.
ezAFM+ Atomic Force Microscope
Precision Nanoscale Imaging in a Compact Package
The NanoMagnetics Instruments ezAFM+ is a high-performance, versatile Atomic Force Microscope designed for both research and industrial applications. Its compact footprint and modular design make it the ideal choice for integration into gloveboxes, inverted light microscopes (ILM), and educational laboratories. Delivering uncompromising resolution in a portable system, the ezAFM+ is the ultimate tool for characterization in confined or controlled environments.
Revolutionary Alignment-Free Scanner Head
One of the most significant challenges in traditional AFM—the time-consuming realignment of the laser and photodiode after cantilever replacement—is entirely eliminated with the ezAFM+. Our patented scanner heads utilize specialized "alignment chips" that work with standard commercial cantilevers featuring alignment grooves. This ensures the laser spot is perfectly positioned every time, enabling users of all skill levels to acquire high-quality data quickly and reliably without the steep learning curve.
Modular Scan Head System for Every Application
The ezAFM+ architecture allows for rapid, tool-free exchange of scan heads, providing flexibility that few other systems can match. Each system can be equipped with scan heads tailored for specific imaging requirements:
Large Range (ezAFM120): Optimized for large area scans up to 120 x 120 x 40 µm, ideal for rough surfaces like textiles, fibers, and polymers.
High Resolution (ezAFM40): Engineered for atomic-scale detail with a 40 x 40 x 4 µm range and a noise floor below 0.02 nm, perfect for graphene and 2D material research.
Comprehensive Suite of Operating Modes
Beyond basic topography, the ezAFM+ supports a full suite of electrical and mechanical characterization modes to unlock the full potential of your samples:
Contact and Dynamic (Tapping) Mode
Magnetic and Electrostatic Force Microscopy (MFM/EFM)
Conductive AFM & Scanning Spreading Resistance Microscopy (SSRM)
Piezo Response and Kelvin Probe Force Microscopy (PRFM/KPFM)
Liquid Operation with the Optional AQUA Scan Head
Integration & Advanced Capabilities
The ezAFM+ is designed to grow with your research. It can be integrated with Inverted Light Microscopes (ILM) for co-localized optical and AFM imaging, providing 3rd party optical data correlation. For air-sensitive samples, the entire system can be operated inside a glovebox, while the compact controller (15 x 15 cm) ensures minimal bench space requirements. Each system comes in a durable Pelican case, making it the most portable high-performance AFM on the market.
ezAFM+
ezAFM+ is our compact atomic force microscopy system. We offer two different scan head options which are 40x40x4 µm or 120x120x40 µm.
ezAFM+ Atomic Force Microscope
Precision Nanoscale Imaging in a Compact Package
The NanoMagnetics Instruments ezAFM+ is a high-performance, versatile Atomic Force Microscope designed for both research and industrial applications. Its compact footprint and modular design make it the ideal choice for integration into gloveboxes, inverted light microscopes (ILM), and educational laboratories. Delivering uncompromising resolution in a portable system, the ezAFM+ is the ultimate tool for characterization in confined or controlled environments.
Revolutionary Alignment-Free Scanner Head
One of the most significant challenges in traditional AFM—the time-consuming realignment of the laser and photodiode after cantilever replacement—is entirely eliminated with the ezAFM+. Our patented scanner heads utilize specialized "alignment chips" that work with standard commercial cantilevers featuring alignment grooves. This ensures the laser spot is perfectly positioned every time, enabling users of all skill levels to acquire high-quality data quickly and reliably without the steep learning curve.
Modular Scan Head System for Every Application
The ezAFM+ architecture allows for rapid, tool-free exchange of scan heads, providing flexibility that few other systems can match. Each system can be equipped with scan heads tailored for specific imaging requirements:
Large Range (ezAFM120): Optimized for large area scans up to 120 x 120 x 40 µm, ideal for rough surfaces like textiles, fibers, and polymers.
High Resolution (ezAFM40): Engineered for atomic-scale detail with a 40 x 40 x 4 µm range and a noise floor below 0.02 nm, perfect for graphene and 2D material research.
Comprehensive Suite of Operating Modes
Beyond basic topography, the ezAFM+ supports a full suite of electrical and mechanical characterization modes to unlock the full potential of your samples:
Contact and Dynamic (Tapping) Mode
Magnetic and Electrostatic Force Microscopy (MFM/EFM)
Conductive AFM & Scanning Spreading Resistance Microscopy (SSRM)
Piezo Response and Kelvin Probe Force Microscopy (PRFM/KPFM)
Liquid Operation with the Optional AQUA Scan Head
Integration & Advanced Capabilities
The ezAFM+ is designed to grow with your research. It can be integrated with Inverted Light Microscopes (ILM) for co-localized optical and AFM imaging, providing 3rd party optical data correlation. For air-sensitive samples, the entire system can be operated inside a glovebox, while the compact controller (15 x 15 cm) ensures minimal bench space requirements. Each system comes in a durable Pelican case, making it the most portable high-performance AFM on the market.
