hpAFM | Atomic Force Microscope
hpAFM is an advanced atomic force microscope that brings a new level of performance, functionality, design and capability. It’s designed to minimize the time to get best results.
High Perfomance Atomic Force Microscopy
hpAFM is an advanced atomic force microscope that brings a new level of performance, functionality, design and capability. It’s designed to minimize the time to get best results. Whether you can work in liquid or in air conditions, it is for everyone from material science to life science. hpAFM offers excellent features such as alignment-free design, closed loop flexure scanner, decoupled z scanner, 10 MP video microscope and flexible operating modes.
general problem of cantilever mounting in the AFM is the re-positioning of the laser and photodiode after cantilever exchange. The laser must be re-aligned to the cantilever and eventually the sample must be re-located. hpAFM offers alignment-free system to overcome this problem. each cantilever mounted to the hpAFM, whether in air or liquid, will automatically and precisely be aligned to continue experiments without laser and photodiode re-alignments. All cantilevers are equipped with alignment grooves or suitable for alignment-series will be exactly aligned when mounted. All major cantilever manufacturers has these type of cantilevers for different modes.
Closed loop flexure scanner
hpAFM’s flexure-based XY scanner uses optical sensor is used to monitor the position of the stage in real time. These readings feed back to the controller to provide error correction for the scan. Closed-loop control ensures that the piezo scanner reaches the desired commanded position. Closed-loop control provides fast, accurate positioning with minimal piezo drift which is very essential for AFM scanning.
Decoupled z scanner
One of the most commonly used AFM scanner configurations is the tube scanner because of its easy fabrication. However, it has some disadvantages: due to their geometry, tube scanners have non-linearity, spesifically bowing, when using the full range of the scanner. In hpAFM with decoupled xy- and z-scanners the xy-scanner is placed under the sample while the z-scanner is placed in the head in order to reduce the cross-talk between the scanners.
hpAFM has very good optical microscope which has 700 nm optical resolution with software-controlled, motorised 5X optical zoom and focus. 8 Mp digital camera gives an opportunity to see the sample from top and let user to go a spesific area on sample surface with same quality either in air or liquid.
The microscope can be operated in the following modes:
Contact Mode AFM
Lateral Force Microscope (LFM)
Dynamic Mode AFM & Phase Imaging
Non-contact Mode AFM with digital PLL
Magnetic Force Microscope (MFM)
Electrostatic Force Microscope (EFM)
Scanning Tunnelling Microscopy (STM)
Piezo Response Force Microscopy (PRFM)
Conductive AFM (CAFM) / Scanning Spreading Resistance Microscopy (SSRM)
AFM Lithography (Scratching)
Force Modulation Mode
Kelvin Probe Force Microscopy (KPFM)
Nano Mechanical Imaging (NMI)
Electro Chemical AFM (EC-AFM)